Measuring internal signals of an integrated circuit

US9823306B2 · kind B2 · utility

Assignee

• TEXAS INSTRUMENTS INCORPORATED · US

Inventors

• Kushal D. Murthy · Bengaluru, IN
• Manish Parmar · Savanuru, IN
• Preetam Charan Anand Tadeparthy · Bengaluru, IN
• Muthusubramanian Venkateswaran · Kanchinakote, IN

Key dates

• Filing date: Feb 11, 2016
• Grant date: Nov 21, 2017
• Expiry date: Mar 5, 2036

Classification

• Technology area (CPC H): Electricity
• CPC primary: H03K19/0948
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An integrated circuit (IC) is provided with functional logic having a plurality of internal signal lines and test logic. The test logic has a plurality of inputs coupled to the plurality of internal signal lines and with an output coupled to a first external pin of the integrated circuit. The test logic includes a buffer, and the test logic is configured to selectively couple each of the signals received on the plurality of signal lines either directly or via the buffer to the first external pin of the IC. The test logic is configured to selectively couple a signal received on a second external pin of the IC either via the buffer to the first external pin of the IC in order to calibrate the buffer.