Topographical measurement system of specular object and topographical measurement method thereof
US9824452B2 · kind B2 · utility
1Cited by
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16Claims
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Key dates
| Filing date | May 10, 2016 |
| Grant date | Nov 21, 2017 |
| Priority date | — |
| Expiry date | Jun 10, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/593
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A topographical measurement system of a specular object and a topographical measurement method thereof are disclosed. The topographical measurement system has a screen, an image capturing device, and an image processing device. The specular object reflects a fringe pattern from the screen, so as to form a virtual image of the fringe pattern. The virtual image is therefore analyzed to obtain a surface profile of the specular object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.