Apparatus and method to adjust power and performance of integrated circuits
US9824773B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 13, 2011 |
| Grant date | Nov 21, 2017 |
| Priority date | — |
| Expiry date | May 17, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The voltage applied to an integrated circuit is scaled so as to account for variations in the manufacturing processes, temperature, and the like, and to allow for power/performance optimization of the integrated circuit. The integrated circuit may characterized during a manufacturing test or anytime thereafter. The characterization data, which reflects the performance and power consumption of the integrated circuit, is used to determine an associated processing/speed bin, which in turn, defines the voltage that will be applied to the integrated circuit during normal operation. Optionally, a number of different supply voltages are applied to different circuit blocks disposed in the same integrated circuit. Each such circuit block may have a different characterization data associated with a different supply voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.