Method and device for detecting defects within a test object

US9829468B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Werner Heinrich · Prenzlau, DE
• Hubert Mooshofer · Birkenfeld, DE

Key dates

• Filing date: Dec 28, 2012
• Grant date: Nov 28, 2017
• Expiry date: Feb 14, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2291/101
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A device and a method for detecting at least one defect in a test object (2). At least one test head (1) radiates an ultrasonic signal at different measuring points (MP) into the test object (2) with each point at an insonation or radiation angle (α) in order to ascertain multiple measurement data sets (MDS). The angle is constant for each data set (MDS). An analyzing unit (4) carries out an SAFT (Synthetic Aperture Focusing Technique) analysis for each ascertained measurement data set (MDS) using a common reconstruction grid (RG) inside the test object (2) in order to calculate an SAFT analysis result for each measurement data set (MDS). The analyzing unit (4) superimposes the calculated SAFT analysis results in order to calculate an orientation-independent defect display value (SRP) for each reconstruction point (RP) of the common reconstruction grid (RG).