Detection of x-rays, and x-ray detector system

US9829586B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Edgar Göderer · Forchheim, DE
• Peter Hackenschmied · Nuremberg, DE
• Steffen Kappler · Effeltrich, DE
• Björn Kreisler · Eschborn, DE
• Miguel Labayen De Inza · Forchheim, DE
• Daniel Niederlöhner · Erlangen, DE
• Mario Reinwand · Breitbrunn, DE
• Christian Schröter · Bamberg, DE
• Matthias Strassburg · Erlangen, DE
• Stefan Wirth · Erlangen, DE

Key dates

• Filing date: Jul 9, 2013
• Grant date: Nov 28, 2017
• Expiry date: Jan 23, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01T1/244
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regulated on the basis of a specified target value. In at least one embodiment, the target value can be specified in a variable manner over time as a sequence of target values. An x-ray detector system is further disclosed, with which the method can be carried out.