High throughput partial wave spectroscopic microscopy and associated systems and methods
US9830501B2 · kind B2 · utility
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8References
26Claims
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Key dates
| Filing date | Jul 23, 2014 |
| Grant date | Nov 28, 2017 |
| Priority date | — |
| Expiry date | Aug 7, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4709
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present technology provides methods, systems, and apparatuses to achieve high throughput and high speed acquisition of partial wave spectroscopic (PWS) microscopic images. In particular, provided herein are high-throughput, automated partial wave spectroscopy (HT/A-PWS) instruments and systems capable of rapid acquisition of PWS Microscopic images and clinical, diagnostic, and research applications thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.