Patent · US Active

Touch trigger probe

US9835433B1 · kind B1 · utility

11Cited by
19References
20Claims
0Family size

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Key dates

Filing dateMay 9, 2017
Grant dateDec 5, 2017
Priority date
Expiry dateMay 9, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/007
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A touch probe for a coordinate measuring machine with a processor which is programmed to generate a trigger signal signalling a contact between a stylus of the probe and a workpiece, whenever one of a plurality displacement signals exceeds a corresponding threshold. In addition, or in alternative, a delayed trigger is generated based on a processing a plurality of samples of displacement signals that are stored in a buffer. The processor is programmed to minimize anisotropy of the probe response. Furthermore, the thresholds can be modified during operations based on commands received from the CMM controller.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.