Patent · US Active

Gas analysis device

US9835556B2 · kind B2 · utility

1Cited by

8References

6Claims

0Family size

Assignee

HORIBA, LTD. · JP

Inventors

Takuya Ido · Kyoto, JP
Yasushi Hirata · Saitama, JP
Toshiaki Nakagawa · Osaka, JP

Key dates

Filing date	Dec 1, 2016
Grant date	Dec 5, 2017
Priority date	—
Expiry date	Dec 1, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/0636
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A gas analysis device includes a probe tube, a flange, an optical system member, and heaters. The probe tube includes an optical path through which measurement light is projected onto a prescribed measurement region of a sample gas flowing through a flue and/or is received from the measurement region. The flange is fixed to the outer periphery of the probe tube and is attached to a pipe side wall. The optical system member projects measurement light onto the sample gas S within the measurement region and/or receives measurement light from the measurement region. The heaters are disposed within the flange and heats the portion where the probe tube and flange are fixed to each other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.