Patent · US Active

Inspection device of display device and inspection method of display device

US9835565B2 · kind B2 · utility

1Cited by
1References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 22, 2015
Grant dateDec 5, 2017
Priority date
Expiry dateFeb 10, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0683
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An inspection device of a display device includes a first illumination unit providing a first incident light to the display device at a first incident angle, a second illumination unit providing a second incident light to the display device at a second incident angle, a third illumination unit providing a third incident light to the display device at a third incident angle, and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.