Method and apparatus for processing signals of semiconductor detector
US9835739B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 15, 2015 |
| Grant date | Dec 5, 2017 |
| Priority date | — |
| Expiry date | Jul 15, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/241
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
The present invention provides a method and apparatus for processing signals of a semiconductor detector, including: acquiring a relationship of a time difference between anode and cathode signals of the semiconductor detector with an anode signal amplitude; obtaining an optimal data screening interval according to the relationship of the time difference between anode and cathode signals of the semiconductor detector with the anode signal amplitude, wherein the optimal data screening interval is an interval where the time difference between the anode and cathode signals is greater than 50 ns; and screening and processing the collected data according to the optimal data screening interval when the semiconductor detector collects data. The present invention better overcomes the inherent crystal defects of the detector, reduces the effect of background noise, increases the energy resolution of the cadmium zinc telluride detector under room temperature, and improves the peak-to-compton ratio.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.