System and method for measuring downhole parameters
US9841525B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2011 |
| Grant date | Dec 12, 2017 |
| Priority date | — |
| Expiry date | Aug 11, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/265
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, tools and techniques for measuring downhole parameters are provided. The techniques involve providing a downhole tool with a sensing apparatus. The sensing apparatus has at least one source positionable about the downhole tool, at least one sensor electrode positionable about a front face of the downhole tool for measuring electrical signals from the source, and a raised insulating cover positionable along the front face of the downhole tool for defining at least one contact surface. The raised insulating cover extends over at least a portion of the sensor electrode whereby the sensor electrode is positionable adjacent to the subterranean formation for electrically coupling thereto without direct contact therewith.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.