System and method to improve enterprise reliability through tracking I/O performance metrics in non-volatile random access memory
US9842660B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2013 |
| Grant date | Dec 12, 2017 |
| Priority date | — |
| Expiry date | Apr 30, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for managing a non-volatile random-access memory (NVRAM)-based storage subsystem, the method including: monitoring, by a slave controller on a NVRAM device of the NVRAM-based storage subsystem, an I/O operation on the NVRAM device; identifying, by the slave controller and based on the monitoring, at least one occurrence of error data; comparing, by the slave controller, a numeric aspect of the at least one occurrence of error data with a threshold setting; reporting, by the slave controller on the NVRAM device and to a master controller of the NVRAM-based storage subsystem, the at least one occurrence of error data in response to the numeric aspect crossing the threshold setting; and ascertaining, by the master controller of the NVRAM-based storage system, a physical location of a defect region on the NVRAM device where the error data has occurred by analyzing the reported at least one occurrence of error data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.