Defect detection method for display panel based on histogram of oriented gradient
US9846932B2 · kind B2 · utility
4Cited by
3References
19Claims
0Family size
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Key dates
| Filing date | Nov 18, 2014 |
| Grant date | Dec 19, 2017 |
| Priority date | — |
| Expiry date | Jun 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In order to detect defects in display panels by an automatic way accurately and quickly, the present invention proposes a method combining image feature extraction and classifier model. It calculates the histograms of oriented gradient (HOG) of images of the display panel collected by an industrial camera of a detection apparatus as feature vectors. Then use them as input samples to train the classifier model to recognize the defects of the display panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.