System and method for scanning a specimen into a focus-stacked scan
US9854163B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Mar 22, 2015 |
| Grant date | Dec 26, 2017 |
| Priority date | — |
| Expiry date | Apr 27, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
This disclosure also teaches a system and method for scanning a specimen into a focus-stacked scan. In one embodiment, a method for scanning the specimen into a focus-stacked scan can comprise illuminating the specimen with a light. The specimen can comprise a topography. The depths of the topography can be variable along a z-axis. The method can also comprise dividing the specimen into a plurality of regions. Each of the regions can comprise a regional peak in the topography. Additionally, the method can comprise sampling each of the regions at a plurality of focal planes orthogonal to the z-axis by capturing, at each focal plane, an image of the region. The image can be focused on the focal plane. Lastly, the method can comprise focus-stacking, for each of the region the images within the region, into a focus-stacked image, and stitching together the focus-stacked images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.