Patent · US Active

Thermographic characterization for surface finishing process development

US9855637B2 · kind B2 · utility

1Cited by
15References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 4, 2015
Grant dateJan 2, 2018
Priority date
Expiry dateApr 16, 2035

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/015
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method and system for observing and monitoring thermal characteristics of a machining operation, such as a surface finishing operation, performed on a workpiece is disclosed. The surface finishing operation can be performed on the workpiece in order to remove a surface defect, e.g. a parting line, on a surface of the workpiece and/or to provide a mirror-like finish to the workpiece. In one embodiment, an emissive layer is applied to the workpiece to increase a thermal emissivity of the workpiece. In some embodiments, a finishing surface, such as a polishing or buffing wheel, and/or a lubricant used in a finishing operation is monitored. A thermal profile of the surface of the workpiece, finishing surface and/or lubricant can be obtained. The finishing operation can be modified in response to the monitored thermal characteristics to prevent the occurrence of defects and improve the efficacy of the finishing operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.