Method for implementing high-precision orientation and evaluating orientation precision of large-scale dynamic photogrammetry system
US9857172B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2017 |
| Grant date | Jan 2, 2018 |
| Priority date | — |
| Expiry date | Sep 25, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30244
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method for implementing high-precision orientation and evaluating orientation precision of a large-scale dynamic photogrammetry system, including steps: a) selecting a scale bar, arranging code points at two ends of the scale bar, and performing length measurement on the scale bar; b) evenly dividing a measurement space into multiple regions, sequentially placing the scale bar in each region, and photographing the scale bar by using left and right cameras; d) limiting self-calibration bundle adjustment by using multiple length constraints, adjustment parameters including principal point, principal distance, radial distortion, eccentric distortion, in-plane distortion, exterior orientation parameter and spatial point coordinate; and e) performing traceable evaluation of orientation precision of the photogrammetry system. The present invention can effectively reduce the relative error in length measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.