Patent · US Active

Fabrication method for micromechanical sensors

US9857229B1 · kind B1 · utility

6Cited by
16References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 21, 2016
Grant dateJan 2, 2018
Priority date
Expiry dateJun 21, 2036

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2201/0132
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of fabricating electromagnetic radiation detection devices including: forming a first mask on a substrate; forming a structural layer on the substrate using the first mask; forming a metallic layer overlying the structural layer; removing the first mask; forming a second mask on the substrate, the second mask comprising mask openings; selectively patterning the metallic layer using the mask openings; and removing the second mask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.