Method for analysis of 3D features using a 2D probabilistic analysis
US9857242B2 · kind B2 · utility
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Key dates
| Filing date | Jun 25, 2014 |
| Grant date | Jan 2, 2018 |
| Priority date | — |
| Expiry date | Mar 10, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N7/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for analyzing a three-dimensional stress concentrating feature of a component (60), such as a borehole (62), using a two-dimensional probabilistic technique. A circumferentially-dependent stress concentration profile around the stress concentrating feature is determined, and then a probability of failure of the component is calculated using a 2D probabilistic failure analysis of the stress concentration profile. The probabilistic failure analysis may include a Monte Carlo theta integration approach.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.