X-ray fluoroscopic imaging system
US9857317B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 23, 2014 |
| Grant date | Jan 2, 2018 |
| Priority date | — |
| Expiry date | Jun 13, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/226
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.