System and method for testing multi-user, multi-input/multi-output systems
US9859995B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 19, 2016 |
| Grant date | Jan 2, 2018 |
| Priority date | — |
| Expiry date | Jan 19, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B7/0413
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.