Patent · US Active

Correction of rotation rate measurements

US9863783B1 · kind B1 · utility

6Cited by
16References
28Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 12, 2016
Grant dateJan 9, 2018
Priority date
Expiry dateOct 12, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C19/5776
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Various implementations directed to correction of rotation rate measurements are provided. In one implementation, a method may include receiving rotation rate measurements about a first axis and a second axis from first gyroscopic sensors. The method may include receiving a first rotation rate measurement about a third axis from a second gyroscopic sensor. The method may include determining an estimated rotation rate measurement about the third axis based on the rotation rate measurements about the first axis and the second axis. The method may include determining a bias value based on a difference between the first rotation rate measurement about the third axis and the estimated rotation rate measurement. The method may include receiving second rotation rate measurements about the third axis from the second gyroscopic sensor. The method may include correcting the second rotation rate measurements about the third axis based on the determined bias value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.