Automated waveform analysis using a parallel automated development system
US9864003B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2017 |
| Grant date | Jan 9, 2018 |
| Priority date | — |
| Expiry date | Jun 12, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.