Scheme applied into electronic device and capable of measuring resistance parameter(s) associated with battery cell
US9864015B2 · kind B2 · utility
3Cited by
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19Claims
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Key dates
| Filing date | Feb 10, 2015 |
| Grant date | Jan 9, 2018 |
| Priority date | — |
| Expiry date | Jan 5, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/385
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method applied into an electronic device and capable of measuring at least one resistance parameter includes: launching a program/application on the electronic device; and using the program/application to measure the at least one resistance parameter that is at least associated with a battery cell connected to and used for providing power to the electronic device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.