Patent · US Active

Test element group, array substrate, test device and test method

US9865517B2 · kind B2 · utility

1Cited by

12References

19Claims

0Family size

Assignee

BOE Technology Group Co., Ltd. · CN

Inventors

Ying Liu · Sanjiaodian, TW
Hongwei Tian · Beijing, CN
Tuo Sun · Beijing, CN

Key dates

Filing date	Jul 13, 2016
Grant date	Jan 9, 2018
Priority date	—
Expiry date	Jul 13, 2036

Classification

Technology area (CPC H)Electricity
CPC primaryH10D86/60
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The present disclosure provides a test element group, an array substrate, a test device and a test method. The test element group includes an array of Thin Film Transistors (TFTs), in which first electrodes of the TFTs in each row are connected to a first connection end, second electrodes of the TFTs in each column are connected to a second connection end, and third electrodes of all of the TFTs in the array are connected to an identical third connection end. The first electrode, the second electrode and the third electrode correspond to the source electrode, the drain source and the gate source of the TFT.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.