Patent · US Active

System for non-destructive testing and method for processing data generated therein

US9869645B2 · kind B2 · utility

1Cited by

4References

18Claims

0Family size

Assignee

General Electric Company · US

Inventors

Ingo Stuke · Reinfeld, DE
Til Florian Guenzler · Halver, DE
Michael Wuestenbecker · Lütjensee, DE
Andreas Beyer · Hanau, DE

Key dates

Filing date	May 26, 2011
Grant date	Jan 16, 2018
Priority date	—
Expiry date	Nov 11, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30164
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.