Method and apparatus for electrical component life estimation
US9869722B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 14, 2016 |
| Grant date | Jan 16, 2018 |
| Priority date | — |
| Expiry date | Oct 14, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2849
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for estimating electrical component degradation caused by an operating parameter that stresses the component in a series of stress cycles, in which cycle count values are maintained which individually correspond to a range of values of the operating parameter, and a plurality of maximum cycle values are stored, which individually correspond to one of the ranges and represent the number of stress cycles in the corresponding range at which the component is expected to have a user defined failure probability value. For a given stress cycle, one of the count values is incremented that corresponds to the range that includes a measured or sensed value, and a cumulative degradation value for the electrical system component is computed as a sum of ratios of the individual count values to the corresponding maximum cycle values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.