Active matrix substrate and display device
US9869913B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 18, 2015 |
| Grant date | Jan 16, 2018 |
| Priority date | — |
| Expiry date | May 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136254
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Inside of a region for inspection set outside a display region of an active matrix substrate, lead-out lines (27a to 27f) connected to data lines pass through in a column direction, and a control line for inspection (31) and six signal lines for inspection (32a to 32f) extend in a row direction. TFTs for inspection (51a to 51f) control a conduction state between the lead-out line and the corresponding signal line for inspection in accordance with a signal on the control line for inspection. Inside the region for inspection, three of the six signal lines for inspection are arranged on one side of the control line for inspection, and the remaining three are arranged on other side of the control line for inspection. One of the two adjacent lead-out lines is connected to one of the former signal lines for inspection via the TFT for inspection (51a, 51c, 51e), and the other is connected to one of the latter signal lines for inspection via the TFT for inspection (51b, 51d, 51f). This suppresses a disconnection, a leakage current, and a luminance unevenness of a screen for inspection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.