Patent · US Active

Embedding resin composition for electron microscopey and method for observing sample with electron microscope using the same

US9870894B2 · kind B2 · utility

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11Claims
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Inventors

Key dates

Filing dateSep 4, 2012
Grant dateJan 16, 2018
Priority date
Expiry dateDec 29, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/225
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention provides an embedding resin composition for electron microscopy having satisfactory performance as an embedding medium, including embedding performance and sectioning quality, and exhibiting excellent antistatic performance; and a method for observing a sample with an electron microscope using the composition. The embedding resin composition for electron microscopy of the present invention having antistatic performance comprises an ionic liquid and an embedding medium comprising an epoxy-based resin, a methacrylate resin or an unsaturated polyester resin. Preferably, the ionic liquid comprising and

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.