Ion source for mass spectrometry
US9870904B2 · kind B2 · utility
11Cited by
4References
18Claims
0Family size
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Key dates
| Filing date | Oct 31, 2014 |
| Grant date | Jan 16, 2018 |
| Priority date | — |
| Expiry date | Oct 31, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N30/7273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the systems and methods can provide efficient cooling of an ion source probe to prevent overheating and the resulting degradation in ion sampling. In some aspects, such cooling can result in improved consistency and/or efficiency of ion formation. Moreover, ion source cooling in accordance with various aspects of the present teachings can allow for the use of higher temperatures in the ionization chamber (thereby improving desolvation) and/or can enable the use of lower flow rate sample sources than with conventional techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.