Patent · US Active

Method of and apparatus for correcting for intensity deviations in a spectrometer

US9874515B2 · kind B2 · utility

2Cited by
8References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 4, 2013
Grant dateJan 23, 2018
Priority date—
Expiry dateOct 13, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/12746
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of determining a pathlength deviation of a sample (610), the method comprising: exposing the sample (610) to electromagnetic radiation at a plurality of wavenumbers, determining electromagnetic absorption in the sample (610) at the plurality of wavenumbers, determining a first wavenumber associated with a first absorption level of an absorption band and a second wavenumber associated with a second absorption level of the absorption band, wherein the second wavenumber is different from the first wavenumber, determining a difference between the first wavenumber and the second wavenumber, and determining the pathlength deviation based on the difference.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.