Patent · US Active

Automated metric information network

US9875404B2 · kind B2 · utility

2Cited by
10References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 2015
Grant dateJan 23, 2018
Priority date
Expiry dateDec 30, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C11/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A Metric Information Network (MIN) with a plurality of Ground Control Points (GCPs) that are selected in an automated fashion. The GCP selection includes clustering algorithms as compared to prior art pair-wise matching algorithms. Further, the image processing that takes place in identifying interest points, clustering, and selecting tie points to be GCPs is all performed before the MIN is updated. By arranging for the processing to happen in this manner, the processing that is embarrassingly parallel (identifying interest points, clustering, and selecting tie points) can be performed in a distributed fashion across many computers and then the MIN can be updated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.