Stochastic jitter measuring device and method
US9876697B2 · kind B2 · utility
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3References
19Claims
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Inventor
Key dates
| Filing date | Jul 15, 2016 |
| Grant date | Jan 23, 2018 |
| Priority date | — |
| Expiry date | Jul 15, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L65/80
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A jitter measuring setup (10) comprises a signal generator (14), a sample-and-hold circuit (15), and the inventive all stochastic jitter measuring device (1) comprising signal acquisition means (2) and calculation means (3). The input signal of the sample-and-hold circuit (15) is generated by the signal generator (14). Furthermore, the output signal of the sample-and-hold circuit (15), respectively the input signal of the measuring device (1), is comprised of a superposition of the sampled input signal of the sample-and-hold circuit (15) and a cyclostationary random process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.