Patent · US Active

Fabrication of tungsten MEMS structures

US9878901B2 · kind B2 · utility

5Cited by
13References
19Claims
0Family size

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Key dates

Filing dateMar 27, 2015
Grant dateJan 30, 2018
Priority date
Expiry dateMar 27, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04R19/005
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

Thick (i.e., greater than two microns), fine-grained, low-stress tungsten MEMS structures are fabricated at low temperatures, particularly for so-called “MEMS last” fabrication processes (e.g., when MEMS structures are fabricated after electronic circuitry is fabricated). Means for very accurately etching structural details from the deposited tungsten layer and for strongly and stably anchoring the tungsten layer to an underlying substrate are disclosed. Also, means for removing a sacrificial layer underlying the mobile tungsten layer without damaging the tungsten or allowing it to be drawn down and stuck by surface tension is disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.