Wear measurement system using a computer model
US9880075B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 11, 2016 |
| Grant date | Jan 30, 2018 |
| Priority date | — |
| Expiry date | Apr 1, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A wear measurement system for a component is disclosed. The wear measurement system may include an imaging device configured to obtain a plurality of two-dimensional images of the component. The wear measurement system may also include a controller. The controller may be configured to generate a three-dimensional point cloud representing the component based on the two-dimensional images. The controller may also be configured to overlay a computer model of the component on the three-dimensional point cloud. Further, the controller may be configured to project the computer model on the two-dimensional images. The controller may also be configured to select at least two reference points appearing in each of a subset of images selected from the two-dimensional images. The controller may be configured to determine locations of the two reference points in the three-dimensional point cloud, determine an image distance between the locations, and determine an amount of wear based on the image distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.