Material erosion monitoring system and method
US9880110B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 8, 2016 |
| Grant date | Jan 30, 2018 |
| Priority date | — |
| Expiry date | Nov 8, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/388
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.