Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test
US9880210B2 · kind B2 · utility
1Cited by
7References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2015 |
| Grant date | Jan 30, 2018 |
| Priority date | — |
| Expiry date | Jan 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanner system and method operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT) are provided. The electromagnetic field level radiated by the DUT is measured with a probe array comprising a plurality of spatially separated switched probes, an analyzer, and a computer. An actuator changes the relative position of the probe array to the DUT by a distance less than or equal to the separation distance between the probes, and the electromagnetic field level is measured and stored again.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.