Intelligent spectral induced polarization measurement module

US9880312B2 · kind B2 · utility

Assignees

• ONTASH & ERMAC, INC. · US
• Rutgers, the State University of New Jersey · US

Inventors

• Lee Slater · Portland, US
• Dimitrios Ntarlagiannis · River Edge, US
• Frank Curatola · River Edge, US
• Dean Pappas · Hamilton Square, US
• Donald V. Le Roy · Doylestown, US
• Konstantin Evdokimov · Belmont, US

Key dates

• Filing date: Nov 20, 2013
• Grant date: Jan 30, 2018
• Expiry date: Mar 28, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01V3/24
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system for spectral induced polarization measurement of a formation is provided. The system provides an intelligent module to be utilized in performing spectral induced polarization (SIP) measurements for geophysical studies or otherwise. The system includes a instrument that includes a housing configured to be inserted into a surface opening. The housing houses a signal generator that generates an excitation signal. A drive electrode directs the excitation signal into the material adjacent the housing. A plurality of electrodes sense the voltage and/or current in the material adjacent the housing and a processor processes the sensed voltage and/or current to measure a property of the material. The system also provides a configuration in which a plurality of instruments configured for spectral induced polarization measurements are interconnected to provide communication, synchronization, a common reference signal or power.