Patent · US Active

Multiple wavelengths real time phase shift interference microscopy

US9880377B1 · kind B1 · utility

16Cited by

3References

13Claims

0Family size

Assignee

PHOTONICSYS LTD.

Inventors

Avner Safrani · Beer Sheva, IL
Michael Ney · Eagan, US
Ibrahim Abdulhalim · Bet Shemesh, IL

Key dates

Filing date	Sep 9, 2016
Grant date	Jan 30, 2018
Priority date	—
Expiry date	Sep 9, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG02B27/286
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.