Testing system and method
US9881510B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2012 |
| Grant date | Jan 30, 2018 |
| Priority date | — |
| Expiry date | Dec 21, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09B19/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.