Coherence measuring device for spin-polarized electron beam and method using the same
US9881767B2 · kind B2 · utility
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Key dates
| Filing date | Sep 28, 2015 |
| Grant date | Jan 30, 2018 |
| Priority date | — |
| Expiry date | Sep 28, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2614
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A path of a spin-polarized electron beam is split into two by a splitter. A spin direction of the spin-polarized electron beam is rotated by a spin direction rotator disposed on a first path, and delayed by a first delay device. On a second path, the electron beam passes through a sample stage. The spin-polarized electron beams split into the first path and the second path are superposed by a biprism, and its intensity distribution is measured. Coherence is measured from a relation between a spin direction rotation angle, a delay time, and a visibility of an interference fringe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.