Method for measuring performance parameters and detecting bad pixels of an infrared focal plane array module
US9883178B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 10, 2015 |
| Grant date | Jan 30, 2018 |
| Priority date | — |
| Expiry date | Mar 9, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring performance parameters of an infrared focal plane array (IRFPA) module has steps of capturing continuous digital images from the IRFPA module, performing image division on each of the continuous digital images, and measuring multiple performance parameters of each divided digital image, including signal transmission function, a temporal noise equivalent temperature difference, a spatial noise equivalent temperature difference, non-uniformity and operability, thereby increasing accuracy in measuring the performance parameters of the IRFPA module. Also, a method for detecting bad pixels of an IRFPA module includes a gain value method, an offset value method, a temporal noise method and a spatial noise method, is applicable to the IRFPA module with more than two response areas, and avoids incorrect detection to treat pixels in different response areas as bad pixels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.