Apparatus and method for measuring reference spectrum for sample analysis, and apparatus and method for analyzing sample
US9885607B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 19, 2016 |
| Grant date | Feb 6, 2018 |
| Priority date | — |
| Expiry date | Aug 19, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/425
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring a reference spectrum includes a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample has a value in a range, a reference material spectrum measurer configured to adjust reflectance of a reference material so an intensity of a reflection spectrum of the reference material is not saturated, and measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter, a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material, and a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, when a light source of the spectroscope is turned off.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.