Patent · US Active

Single-layer metalization and via-less metamaterial structures

US9887465B2 · kind B2 · utility

3Cited by
46References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 1, 2013
Grant dateFeb 6, 2018
Priority date
Expiry dateMar 8, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01Q5/307
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

Techniques and apparatus based on metamaterial structures provided for antenna and transmission line devices, including single-layer metallization and via-less metamaterial structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.