Patent · US Active

Germanium smoothing and chemical mechanical planarization processes

US9890300B2 · kind B2 · utility

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20Claims
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Key dates

Filing dateApr 18, 2017
Grant dateFeb 13, 2018
Priority date
Expiry dateApr 18, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30625
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Method for chemical mechanical planarization is provided, which includes: forming a dielectric layer containing at least one opening, the dielectric layer is located on a substrate; epitaxially growing a germanium material within the at least one opening of the dielectric layer, the germanium material extending above a topmost surface of the dielectric layer; and planarizing the germanium material using at least one slurry composition to form coplanar surfaces of the germanium material and the dielectric layer, where a slurry composition of at least one slurry composition polishes the germanium material selective to the topmost surface of the dielectric layer, and includes an abrasive, at least one pH modulator, and an oxidizer, the at least one pH modulator including an acidic pH modulator, and lacking a basic pH modulator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.