Secure low voltage testing
US9891277B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2014 |
| Grant date | Feb 13, 2018 |
| Priority date | — |
| Expiry date | May 16, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31701
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit includes a normal voltage detector configured to detect a normal voltage at which the integrated circuit being fully functional. A first voltage detector detects a first voltage that is less than the normal voltage. A second voltage detector detects a second voltage that is less than the first voltage. A reset module is coupled to a supply voltage, the normal voltage detector, the first voltage detector, and the second voltage detector. The reset module includes test logic to, when the supply voltage rises to the first voltage from the second voltage, perform a pass/fail test when the integrated circuit is in a pass/fail test mode, and perform a power up reset when the integrated circuit in not in the pass/fail test mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.