Apparatus and method for inspecting material of an object
US9897540B2 · kind B2 · utility
0Cited by
8References
6Claims
0Family size
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Key dates
| Filing date | Jan 19, 2016 |
| Grant date | Feb 20, 2018 |
| Priority date | — |
| Expiry date | Feb 7, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J1/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A material inspection apparatus includes a light source, a light receiver, a light converter, and a processing unit. The light source is configured to emit light to a surface of an object to be inspected. The light receiver is configured to receive light reflected from the surface of the object. The light converter is configured to convert the light received by the light receiver into an electric current. The processing unit is configured to determine, according to the electric current, a material of the surface of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.