Method of testing anti-high temperature performance of a magnetic head and apparatus thereof
US9899046B2 · kind B2 · utility
0Cited by
7References
42Claims
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Key dates
| Filing date | Apr 29, 2011 |
| Grant date | Feb 20, 2018 |
| Priority date | — |
| Expiry date | Aug 5, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B27/36
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of testing anti-high temperature performance of a magnetic head comprises applying a plurality of second magnetic fields with different intensities in a second direction to the magnetic head, and measuring a second output parameter curve, and judging whether a variation that is beyond an allowable value is presented on the second output parameter curve, therein the second direction passes through the ABS and at an angle whose absolute value is an acute angle to the ABS. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.