Photothermal examination method and corresponding examination unit
US9903828B2 · kind B2 · utility
1Cited by
5References
27Claims
0Family size
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Key dates
| Filing date | Apr 29, 2015 |
| Grant date | Feb 27, 2018 |
| Priority date | — |
| Expiry date | Apr 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A photothermal examination method and corresponding examination unit are provided. In the method first and second zones of the surface to be characterized are scanned simultaneously, and first and second photosensitive surfaces separate from one another acquire images of the infrared radiation emitted by these two zones.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.