Patent · US Active

Process measuring device for a measuring and control technology

US9903909B2 · kind B2 · utility

1Cited by

4References

5Claims

0Family size

Assignee

ENDRESS+HAUSER GMBH+CO.KG · DE

Inventors

Dietmar Spanke · Steinen, DE
Herbert Schroth · Schopfheim, DE
Manfred Hammer · Wehr, DE

Key dates

Filing date	Oct 15, 2007
Grant date	Feb 27, 2018
Priority date	—
Expiry date	Apr 15, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2849
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An electronic device including electronics arranged in an electronics compartment and having electronic and/or electromechanical components. The device automatically detects and/or monitors wear of its electronic and/or electromechanical components and includes an apparatus for detecting and/or monitoring wear of the electronic and/or electromechanical components. Included is at least one element arranged in the electronics compartment. This element is independent of the electronics and has at least one physical property, which changes irreversibly as a function of wear of the element. The apparatus further includes a circuit for measuring the physical property, and an evaluating unit, which, based on the measured physical property, detects and/or monitors wear of the element and makes available a wear-dependent output signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.