Introducing hydrogen gas to an ICP instrument for enhanced detection of low-sensitivity elements
US9909957B1 · kind B1 · utility
1Cited by
2References
6Claims
0Family size
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Key dates
| Filing date | Dec 28, 2012 |
| Grant date | Mar 6, 2018 |
| Priority date | — |
| Expiry date | Nov 17, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting material in a sample using an ICP instrument includes preparing the sample for analysis by the ICP instrument using hydrogen gas. For example, hydrogen gas can be generated by initiating a hydride generation reaction with the sample. Further, hydrogen gas can be introduced to a component part of the sample. For instance, hydrogen gas can be added to an injector gas in a spray chamber of the ICP instrument.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.